Study
Semiconductor soft error simulation
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We are developing simulation technology for evaluating the probability of soft error occurrence by using PHITS
in cooperation with universities and private companies.
In the research so far, we have developed a multiple sensitive region model
as a practical model for calculating the soft error occurrence rate with high accuracy and in a short time, and implemented it in PHITS.
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| Image of soft error in a semiconductor device
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[1] S. Abe and T. Sato,
Proceedings of 2020 IEEE International Reliability Physics Symposium, April 28 - May 30, Virtual Conference, 8C.5.1-8C.5.6 (2020).
[2] S. Abe, et al, IEEE Trans. Nucl. Sci., 66, 1374-1380 (2019).
[3] S. Abe and T. Sato, Proceedings of 2016 16th European Conference on Radiation and Its Effects on Components and Systems, September 19-23, Bremen Germany, PE-06 (2016).
[4] S. Abe and T. Sato, J. Nucl. Sci. Technol., 53, 451-458 (2016).
Copyright© Japan Atomic Energy Agency, Research Group for Radiation Transport Analysis